Microscopy of adsorbates by surface second-harmonic generation

Microscopy of adsorbates by surface second-harmonic generation

Optical second harmonic generation has been applied to a new technique of microscopy. 5 mu m resolution has been obtained in imaging of submonolayer-level concentration profiles of Sb and Ge(111), and quantitative measurements of surface diffusion are obtained. Possible applications of this method t...

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Veröffentlicht in:Journal of the Optical Society of America. B, Optical physics Optical physics, 1993-03, Vol.10 (3), p.546-550
Hauptverfasser: Schultz, K. A., Suni, I. I., Seebauer, E. G.
Format: Artikel
Sprache:eng
Schlagworte:
440600 - Optical Instrumentation- (1990-)
ADSORPTION
ANTIMONY
DIFFUSION
ELEMENTS
FREQUENCY MIXING
GERMANIUM
HARMONIC GENERATION
METALS
MICROSCOPY
MONITORING
NONLINEAR OPTICS
OPTICAL MICROSCOPY
OPTICS
OTHER INSTRUMENTATION
QUANTITY RATIO
RESOLUTION
SORPTION
SPATIAL RESOLUTION
SURFACE PROPERTIES
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Beschreibung
Zusammenfassung:Optical second harmonic generation has been applied to a new technique of microscopy. 5 mu m resolution has been obtained in imaging of submonolayer-level concentration profiles of Sb and Ge(111), and quantitative measurements of surface diffusion are obtained. Possible applications of this method to diffusion under gaseous and liquid ambients is indicated.
ISSN:0740-3224
1520-8540
DOI:10.1364/JOSAB.10.000546