A NEXAFS study of thin polyacrylonitrile films electrochemically deposited on Ni : the effect of the film thickness and annealing treatment

Polyacrylonitrile (PAN) thin films electrochemically deposited on Ni have been studied by near edge x‐ray absorption fine structure, as a function of the film thickness and annealing treatment. For 20Å thick films, the polymer chains are oriented perpendicular to the surface with the C≡N groups parallel to it. Below a few angstroms, no polymerization occurs but molecules are adsorbed perpendicular to the surface. Annealing at 300°C results in the loss of the majority part of the N content of the film in contrast with the admitted mechanism for bulk PAN.