Reducing field emission in superconducting RF cavities for the next generation of particle accelerators

Heat treatment up to 1500 degrees C in an ultrahigh-vacuum furnace, along with processing of cavities and temperature mapping was used to suppress field emission and analyze emitter properties. In 27 tests of one-cell 1500-MHz fired accelerating cavities, on the average the accelerating field, E/sub...

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Veröffentlicht in:	IEEE Transactions on Magnetics (Institute of Electrical and Electronics Engineers); (United States) 1991-03, Vol.27 (2), p.1935-1939
Hauptverfasser:	Shu, Q.S., Hartung, W., Leibovich, A., Kirchgessner, J., Moffat, D., Noer, R., Padamsee, H., Rubin, D., Sears, J.
Format:	Artikel
Sprache:	eng
Schlagworte:	430300 > Particle Accelerators-- Auxiliaries & Components Acceleration ACCELERATORS Applied sciences CAVITY RESONATORS Chemicals CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY Electric breakdown ELECTRONIC EQUIPMENT Electronics ELEMENTS EMISSION Exact sciences and technology FIELD EMISSION FLUIDS GASES HEAT TREATMENTS HELIUM History Iron Life estimation Linear particle accelerator Niobium NONMETALS PARTICLE ACCELERATORS Radio frequency RARE GASES RESONATORS RF SYSTEMS Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices SUPERCONDUCTING CAVITY RESONATORS Superconducting devices SUPERCONDUCTING DEVICES 665412 > Superconducting Devices-- (1992-) TEMPERATURE MEASUREMENT Testing
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Beschreibung
Zusammenfassung:	Heat treatment up to 1500 degrees C in an ultrahigh-vacuum furnace, along with processing of cavities and temperature mapping was used to suppress field emission and analyze emitter properties. In 27 tests of one-cell 1500-MHz fired accelerating cavities, on the average the accelerating field, E/sub acc/, increased to 24 MV/m (H/sub pk/=1250 Oe) from 13 MV/m with chemical treatment alone; the highest E/sub acc/ reached was 30.5 MV/m. Emitter properties, efficiency of He processing, and results of the exposure of well-processed RF surfaces to various media are also discussed.
ISSN:	0018-9464 1941-0069
DOI:	10.1109/20.133581