Fully symmetric cooled CMOS on (110) plane

A new cooled CMOS device using dual-polysilicon gates, (110) Si substrates, lightly doped drains with doping concentrations of 10 super(14) cm super(-2), and no channel implant is described. It is found that the peak mobility of a p super(+) polysilicon gate pMOS transistor on a (110) plane is 1.6 t...

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Veröffentlicht in:IEEE transactions on electron devices 1989-08, Vol.36 (8), p.1429-1433
Hauptverfasser: AOKI, M, YANO, K, MASUHARA, T, SHIMOHIGASHI, K
Format: Artikel
Sprache:eng
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Zusammenfassung:A new cooled CMOS device using dual-polysilicon gates, (110) Si substrates, lightly doped drains with doping concentrations of 10 super(14) cm super(-2), and no channel implant is described. It is found that the peak mobility of a p super(+) polysilicon gate pMOS transistor on a (110) plane is 1.6 times larger than that on a (100) plane at 77 K. This pMOS transistor is very promising for use at 77 K because of its steeper subthreshold slope and higher hole mobility. The design has realized fully symmetric cooled CMOS devices with 0.8- mu m gates in which saturation currents and transconductances of both n and pMOS transistors have been almost equalized.
ISSN:0018-9383
1557-9646
DOI:10.1109/16.30955