X-ray photoelectron and NMR studies of polyfluorinated C[sub 60]. Evidence that C-C bonds are broken
In order to better understand the properties and composition of solids of polyfluorinated C[sub 60], X-ray photoelectron spectroscopy (XPS) was used to characterize several different C[sub 60]F[sub x] samples synthesized in two different laboratories. Quantitative measurements of the F[sub 1s], C[su...
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Veröffentlicht in: | Journal of the American Chemical Society 1994-02, Vol.116:3 |
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Hauptverfasser: | , , , , , , , , , , , |
Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | In order to better understand the properties and composition of solids of polyfluorinated C[sub 60], X-ray photoelectron spectroscopy (XPS) was used to characterize several different C[sub 60]F[sub x] samples synthesized in two different laboratories. Quantitative measurements of the F[sub 1s], C[sub 1s], and O[sub 1s] XPS signals established the elemental stoichiometry of each sample. The F/C ratios for the different samples ranged from 28/60 to 53/60 in general agreement with previous mass spectroscopy studies of each sample. C[sub 15] energies and shifts as well as solid-state nuclear magnetic resonance studies provided additional information about the degree of fluorination and level of C-C bond breaking. 22 refs., 3 figs., 3 tabs. |
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ISSN: | 0002-7863 1520-5126 |
DOI: | 10.1021/ja00082a039 |