Quantitative trace element analyses in thick samples with heavy-ion-induced x-ray fluorescence

Quantitative trace element analyses in thick samples with heavy-ion-induced x-ray fluorescence

A procedure is described for obtaining quantitative analysis of trace elements in a thick sample by heavy-ion-induced x-ray fluorescence. The method avoids difficulties involved in preparing thin uniform samples and yields absolute abundances of impurity elements without utilizing internal standards...

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Veröffentlicht in:Journal of applied physics 1973-10, Vol.44 (10), p.4749-4752
Hauptverfasser: Shabason, L., Cohen, B. L., Wedberg, G. H., Chan, K. C.
Format: Artikel
Sprache:eng
Schlagworte:
ALUMINIUM- X-RAY FLUORESCENCE ANALYSIS
BERYLLIUM- X-RAY FLUORESCENCE ANALYSIS
COAL- X-RAY FLUORESCENCE ANALYSIS
HEAVY IONS
IMPURITIES
MICROANALYSIS
N40130 -Chemistry-Analytical & Separations Chemistry- Radiometric & Radiochemical Procedures
QUANTITATIVE CHEMICAL ANALYSIS
TRACE AMOUNTS
X-RAY FLUORESCENCE ANALYSIS
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Beschreibung
Zusammenfassung:A procedure is described for obtaining quantitative analysis of trace elements in a thick sample by heavy-ion-induced x-ray fluorescence. The method avoids difficulties involved in preparing thin uniform samples and yields absolute abundances of impurity elements without utilizing internal standards.
ISSN:0021-8979
1089-7550
DOI:10.1063/1.1662030