Study of the physical properties of CuS thin films grown by SILAR method

CuS thin films were obtained using the SILAR method on an amorphous glass substrate. All experiments were performed at room temperature. CuS thin films were deposited at 30, 40, 50 and 60 cycles, respectively. Structural, morphological and optical properties of the structures that increase the thick...

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Veröffentlicht in:	Optical and quantum electronics 2019-07, Vol.51 (7), p.1-9, Article 245
1. Verfasser:	Çayır Taşdemirci, Tuba
Format:	Artikel
Sprache:	eng
Schlagworte:	ABSORPTION ATOMIC FORCE MICROSCOPY Characterization and Evaluation of Materials Computer Communication Networks COPPER SULFIDES CRYSTAL STRUCTURE Electrical Engineering GLASS Glass substrates Lasers Microscopy NANOSCIENCE AND NANOTECHNOLOGY NANOSTRUCTURES Optical Devices OPTICAL PROPERTIES Optics Photonics Physical properties Physics Physics and Astronomy SCANNING ELECTRON MICROSCOPY SUBSTRATES TEMPERATURE RANGE 0273-0400 K THICKNESS THIN FILMS X-RAY DIFFRACTION
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