Scatter Signal Elimination by Localized Primary Modulation in Industrial Computed Radiography

In industrial computed radiography, same as the other projection imaging systems, quantitative integrated information of total beam path including the object is carried by primary part of the beam. It is well known that the accuracy of the image useful data carried by the primary part degrades by scattered part of the beam. In order to have the beam path quantitative information accurately, it is essential to obtain the primary part of the total signal purely. In current study, a practical approach using localized primary modulation has been proposed to extract the primary signal. A semi-transparent beam attenuation grid was used as the beam intensity modulator. Efficiency and accuracy of the approach was practically validated through thickness measurement of metallic planar steps as an illustrative example. Simplified practical implementation and availability of the required accessories are some of advantages of the proposed approach. The results are indicative of the fact that this approach can also be applied as a new technique in thickness measurement, yielding a noticeable accuracy improvement in the most radiography methods. A procedure is included to explain the approach implementation for thickness measurement in computed radiography systems. The procedure overcomes some practical limitations and difficulties of the approach adaptation for computed radiography.