Structural Modification of PECVD As{sub 50}S{sub 50} Chalcogenide-Glass Films by Femtosecond Laser Radiation
A thin film of As{sub 50}S{sub 50} chalcogenide glass modified by femtosecond laser radiation at a wavelength of 800 nm has been studied. The character of the modification has been analyzed by interferometry, atomic-force microscopy, and Raman spectroscopy. The relationship between a change in the r...
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Veröffentlicht in: | Optics and spectroscopy 2018-05, Vol.124 (5) |
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creator | Romashkin, A. V. Murzanev, A. A. Kiselev, A. M. Korytin, A. I. Kudryashov, M. A. Nezhdanov, A. V. Mochalov, L. A. Mashin, A. I. Stepanov, A. N. |
description | A thin film of As{sub 50}S{sub 50} chalcogenide glass modified by femtosecond laser radiation at a wavelength of 800 nm has been studied. The character of the modification has been analyzed by interferometry, atomic-force microscopy, and Raman spectroscopy. The relationship between a change in the refractive index upon the sample modification and structural changes in the glass network is determined. |
doi_str_mv | 10.1134/S0030400X18050193 |
format | Article |
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The relationship between a change in the refractive index upon the sample modification and structural changes in the glass network is determined.</description><subject>ARSENIC COMPOUNDS</subject><subject>ATOMIC FORCE MICROSCOPY</subject><subject>CHALCOGENIDES</subject><subject>CHEMICAL VAPOR DEPOSITION</subject><subject>CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY</subject><subject>GLASS</subject><subject>INTERFEROMETRY</subject><subject>LASER RADIATION</subject><subject>MODIFICATIONS</subject><subject>RAMAN SPECTROSCOPY</subject><subject>REFRACTIVE INDEX</subject><subject>SULFUR COMPOUNDS</subject><subject>THIN FILMS</subject><subject>WAVELENGTHS</subject><issn>0030-400X</issn><issn>1562-6911</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2018</creationdate><recordtype>article</recordtype><recordid>eNqNjEtLw0AUhQdRMD5-gLsLXafem0xisiyxqQsFMSLuynQysSPTDOROFlL8731g967Oge87R4g7wilRKu8bxBQl4icVmCGV6ZmIKMuTOC-JzkV0wPGBX4or5m9EokKWkXBNGEYdxkE5ePGt7axWwfoefAev8-rjEWa85XEFGf42pwLVWjntv0xvWxMvnGKG2roNw-oHarMJno32fQvPis0Ab6q1x9MbcdEpx-b2L6_FpJ6_V0-x52CXrG0wer0f9kaHZZI8FLmUlP7P2gFUL08k</recordid><startdate>20180515</startdate><enddate>20180515</enddate><creator>Romashkin, A. 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N.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Structural Modification of PECVD As{sub 50}S{sub 50} Chalcogenide-Glass Films by Femtosecond Laser Radiation</atitle><jtitle>Optics and spectroscopy</jtitle><date>2018-05-15</date><risdate>2018</risdate><volume>124</volume><issue>5</issue><issn>0030-400X</issn><eissn>1562-6911</eissn><abstract>A thin film of As{sub 50}S{sub 50} chalcogenide glass modified by femtosecond laser radiation at a wavelength of 800 nm has been studied. The character of the modification has been analyzed by interferometry, atomic-force microscopy, and Raman spectroscopy. The relationship between a change in the refractive index upon the sample modification and structural changes in the glass network is determined.</abstract><cop>United States</cop><doi>10.1134/S0030400X18050193</doi></addata></record> |
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subjects | ARSENIC COMPOUNDS ATOMIC FORCE MICROSCOPY CHALCOGENIDES CHEMICAL VAPOR DEPOSITION CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY GLASS INTERFEROMETRY LASER RADIATION MODIFICATIONS RAMAN SPECTROSCOPY REFRACTIVE INDEX SULFUR COMPOUNDS THIN FILMS WAVELENGTHS |
title | Structural Modification of PECVD As{sub 50}S{sub 50} Chalcogenide-Glass Films by Femtosecond Laser Radiation |
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