Structural Modification of PECVD As{sub 50}S{sub 50} Chalcogenide-Glass Films by Femtosecond Laser Radiation

Structural Modification of PECVD As{sub 50}S{sub 50} Chalcogenide-Glass Films by Femtosecond Laser Radiation

A thin film of As{sub 50}S{sub 50} chalcogenide glass modified by femtosecond laser radiation at a wavelength of 800 nm has been studied. The character of the modification has been analyzed by interferometry, atomic-force microscopy, and Raman spectroscopy. The relationship between a change in the r...

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Veröffentlicht in:Optics and spectroscopy 2018-05, Vol.124 (5)
Hauptverfasser: Romashkin, A. V., Murzanev, A. A., Kiselev, A. M., Korytin, A. I., Kudryashov, M. A., Nezhdanov, A. V., Mochalov, L. A., Mashin, A. I., Stepanov, A. N.
Format: Artikel
Sprache:eng
Schlagworte:
ARSENIC COMPOUNDS
ATOMIC FORCE MICROSCOPY
CHALCOGENIDES
CHEMICAL VAPOR DEPOSITION
CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY
GLASS
INTERFEROMETRY
LASER RADIATION
MODIFICATIONS
RAMAN SPECTROSCOPY
REFRACTIVE INDEX
SULFUR COMPOUNDS
THIN FILMS
WAVELENGTHS
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Zusammenfassung:A thin film of As{sub 50}S{sub 50} chalcogenide glass modified by femtosecond laser radiation at a wavelength of 800 nm has been studied. The character of the modification has been analyzed by interferometry, atomic-force microscopy, and Raman spectroscopy. The relationship between a change in the refractive index upon the sample modification and structural changes in the glass network is determined.
ISSN:0030-400X
1562-6911
DOI:10.1134/S0030400X18050193