Electrical and Magnetic Properties of Ultrathin Polycrystalline Fe Films Grown on SiO{sub 2}/Si(001)

Electrical and Magnetic Properties of Ultrathin Polycrystalline Fe Films Grown on SiO{sub 2}/Si(001)

Ultrathin polycrystalline Fe films have been grown on the oxidized surface of a Si(001) substrate. The resistivity and magnetic hysteresis of Fe films have been measured in the range of thickness from 2.5 to 10 nm. Based on the analysis of the data obtained, it is suggested that there is a transitio...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Technical physics letters 2018-07, Vol.44 (7)
Hauptverfasser: Balashev, V. V., Ermakov, K. S., Chebotkevich, L. A., Korobtsov, V. V.
Format: Artikel
Sprache:eng
Schlagworte:
ELECTRICAL PROPERTIES
HYSTERESIS
INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
MAGNETIC PROPERTIES
ORIENTATION
POLYCRYSTALS
SILICON
SILICON OXIDES
SUBSTRATES
SURFACES
THICKNESS
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:Ultrathin polycrystalline Fe films have been grown on the oxidized surface of a Si(001) substrate. The resistivity and magnetic hysteresis of Fe films have been measured in the range of thickness from 2.5 to 10 nm. Based on the analysis of the data obtained, it is suggested that there is a transition to the structurally continuous film at a thickness of ~6 nm. It is found that Fe grains in this film acquire the preferred (111) orientation during this transition.
ISSN:1063-7850
1090-6533
DOI:10.1134/S1063785018070040