Development of methods for ultrasonic scanning of X-ray wavelength

Development of methods for ultrasonic scanning of X-ray wavelength

The method for X-ray wavelength tuning using an adaptive element (a quartz monolithic resonator modulated by a standing longitudinal low-frequency ultrasonic wave) has been proposed and implemented. This method is characterized by high tuning accuracy and possibility of scanning X-ray beam parameter...

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Veröffentlicht in:Crystallography reports 2017-11, Vol.62 (6), p.831-836
Hauptverfasser: Blagov, A. E., Pisarevskii, Yu. V., Prosekov, P. A., Targonskii, A. V., Eliovich, Ya. A., Protsenko, A. I., Koval’chuk, M. V.
Format: Artikel
Sprache:eng
Schlagworte:
ACCURACY
CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY
Crystallography and Scattering Methods
Diffraction and Scattering of Ionizing Radiations
Physics
Physics and Astronomy
QUARTZ
RESONATORS
Scanning
TIME RESOLUTION
TUNING
Ultrasonic testing
ULTRASONIC WAVES
WAVELENGTHS
X RADIATION
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Beschreibung
Zusammenfassung:The method for X-ray wavelength tuning using an adaptive element (a quartz monolithic resonator modulated by a standing longitudinal low-frequency ultrasonic wave) has been proposed and implemented. This method is characterized by high tuning accuracy and possibility of scanning X-ray beam parameters with a time resolution of up to 3 μs.
ISSN:1063-7745
1562-689X
DOI:10.1134/S1063774517060037