Rb{sub 1– x}Cs{sub x}NO{sub 3} (x = 0.025, 0.05, 0.1) Single Crystals and Their High-Temperature X-Ray Study

Rb{sub 1– x}Cs{sub x}NO{sub 3} (x = 0.025, 0.05, 0.1) Single Crystals and Their High-Temperature X-Ray Study

Polymorphic transformations in Rb{sub 0.975}Cs{sub 0.025}NO{sub 3}, Rb{sub 0.950}Cs{sub 0.05}NO{sub 3}, and Rb{sub 0.90}Cs{sub 0.1}NO{sub 3} crystals grown by us have been studied by the X-ray diffraction method. Four different modifications are found for crystals in the range from room temperature...

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Veröffentlicht in:Semiconductors (Woodbury, N.Y.) N.Y.), 2018-06, Vol.52 (6)
Hauptverfasser: Haziyeva, A. F., Nasirov, V. I., Asadov, Y. G., Aliyev, Y. I., Jabarov, S. H.
Format: Artikel
Sprache:eng
Schlagworte:
CRYSTALLIZATION
CRYSTALS
DIFFRACTION METHODS
MATERIALS SCIENCE
MELTING POINTS
NITRATES
TEMPERATURE RANGE 0273-0400 K
TEMPERATURE RANGE 0400-1000 K
X-RAY DIFFRACTION
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Zusammenfassung:Polymorphic transformations in Rb{sub 0.975}Cs{sub 0.025}NO{sub 3}, Rb{sub 0.950}Cs{sub 0.05}NO{sub 3}, and Rb{sub 0.90}Cs{sub 0.1}NO{sub 3} crystals grown by us have been studied by the X-ray diffraction method. Four different modifications are found for crystals in the range from room temperature to the melting point. The transformation temperatures and the unit-cell parameters are determined for the crystals of these modifications.
ISSN:1063-7826
1090-6479
DOI:10.1134/S106378261806009X