On the Impact of Barrier-Layer Doping on the Photoluminescence Efficiency of InGaAlAs/InGaAs/InP Strained-Layer Heterostructures

The photoluminescence of strained InGaAlAs/InGaAs/InP heterostructures with an active region consisting of nine In 0.74 Ga 0.26 As quantum wells and δ-doped In 0.53 Al 0.20 Ga 0.27 As barrier layers grown by molecular beam epitaxy on an InP(100) substrate is investigated. Analysis of the photolumine...

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Veröffentlicht in:Semiconductors (Woodbury, N.Y.) N.Y.), 2018-09, Vol.52 (9), p.1156-1159
Hauptverfasser: Kolodeznyi, E. S., Kurochkin, A. S., Rochas, S. S., Babichev, A. V., Novikov, I. I., Gladyshev, A. G., Karachinsky, L. Ya, Savelyev, A. V., Egorov, A. Yu, Denisov, D. V.
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Sprache:eng
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Zusammenfassung:The photoluminescence of strained InGaAlAs/InGaAs/InP heterostructures with an active region consisting of nine In 0.74 Ga 0.26 As quantum wells and δ-doped In 0.53 Al 0.20 Ga 0.27 As barrier layers grown by molecular beam epitaxy on an InP(100) substrate is investigated. Analysis of the photoluminescence spectra demonstrates that p -type doping leads to an increase in the photoluminescence efficiency at low excitation levels in comparison to a heterostructure with undoped barriers, and increasing the level of barrier doping to (1–2) × 10 12 cm –2 results in the suppression of nonradiative recombination.
ISSN:1063-7826
1090-6479
DOI:10.1134/S1063782618090075