Nonuniversal Scaling Behavior of Conductivity Peak Widths in the Quantum Hall Effect in InGaAs/InAlAs Structures
The longitudinal ρ xx and Hall ρ xy resistances were measured in the region of the quantum phase transitions for the quantum Hall effect regime with magnetic fields up to 12 T at temperatures of T = 0.4–30 K in two-dimensional electron systems n -In 0.9 Ga 0.1 As/In 0.81 Al 0.19 As. The nonuniversal...
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Veröffentlicht in: | Semiconductors (Woodbury, N.Y.) N.Y.), 2018-12, Vol.52 (12), p.1551-1558 |
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Hauptverfasser: | , , , , , , , , , |
Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | The longitudinal ρ
xx
and Hall ρ
xy
resistances were measured in the region of the quantum phase transitions for the quantum Hall effect regime with magnetic fields up to 12 T at temperatures of
T
= 0.4–30 K in two-dimensional electron systems
n
-In
0.9
Ga
0.1
As/In
0.81
Al
0.19
As. The nonuniversal scaling behavior of the temperature dependence of the width of the resistance ρ
xx
peaks related to the effect of the large-scale random potential and of Landau-level mixing with opposite spin directions was found. |
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ISSN: | 1063-7826 1090-6479 |
DOI: | 10.1134/S1063782618120102 |