Nonuniversal Scaling Behavior of Conductivity Peak Widths in the Quantum Hall Effect in InGaAs/InAlAs Structures

The longitudinal ρ xx and Hall ρ xy resistances were measured in the region of the quantum phase transitions for the quantum Hall effect regime with magnetic fields up to 12 T at temperatures of T = 0.4–30 K in two-dimensional electron systems n -In 0.9 Ga 0.1 As/In 0.81 Al 0.19 As. The nonuniversal...

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Veröffentlicht in:Semiconductors (Woodbury, N.Y.) N.Y.), 2018-12, Vol.52 (12), p.1551-1558
Hauptverfasser: Gudina, S. V., Arapov, Yu. G., Ilchenko, E. I., Neverov, V. N., Savelyev, A. P., Podgornykh, S. M., Shelushinina, N. G., Yakunin, M. V., Vasil’evskii, I. S., Vinichenko, A. N.
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Sprache:eng
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Zusammenfassung:The longitudinal ρ xx and Hall ρ xy resistances were measured in the region of the quantum phase transitions for the quantum Hall effect regime with magnetic fields up to 12 T at temperatures of T = 0.4–30 K in two-dimensional electron systems n -In 0.9 Ga 0.1 As/In 0.81 Al 0.19 As. The nonuniversal scaling behavior of the temperature dependence of the width of the resistance ρ xx peaks related to the effect of the large-scale random potential and of Landau-level mixing with opposite spin directions was found.
ISSN:1063-7826
1090-6479
DOI:10.1134/S1063782618120102