Electrical parameters of polycrystalline Sm{sub 1–x}Eu{sub x}S rare-earth semiconductors

Electrical parameters of polycrystalline Sm{sub 1–x}Eu{sub x}S rare-earth semiconductors

The electrical parameters of polycrystalline Sm{sub 1–x}Eu{sub x}S compounds are studied. The conductivity, concentration of free electrons, their mobility, and the conductivity activation energy are measured as functions of the quantity x. The structural parameters of the compounds are determined....

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Veröffentlicht in:Semiconductors (Woodbury, N.Y.) N.Y.), 2016-09, Vol.50 (9)
Hauptverfasser: Kaminskii, V. V., Kazanin, M. M., Romanova, M. V., Kamenskaya, G. A., Sharenkova, N. V.
Format: Artikel
Sprache:eng
Schlagworte:
ACTIVATION ENERGY
CARRIER MOBILITY
CONCENTRATION RATIO
ELECTRIC CONDUCTIVITY
ELECTRIC POTENTIAL
ELECTRONS
EUROPIUM COMPOUNDS
MATERIALS SCIENCE
POLYCRYSTALS
SAMARIUM SULFIDES
SEEBECK EFFECT
SEMICONDUCTOR MATERIALS
TEMPERATURE DEPENDENCE
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Zusammenfassung:The electrical parameters of polycrystalline Sm{sub 1–x}Eu{sub x}S compounds are studied. The conductivity, concentration of free electrons, their mobility, and the conductivity activation energy are measured as functions of the quantity x. The structural parameters of the compounds are determined. A heterostructure is fabricated with x in the range from 0 to 0.3, and the electrical voltage generated by the structure, when heated to a temperature of T = 450 K, due to the thermovoltaic effect is measured. This voltage is found to be 55 mV. A method for measuring the thermally induced voltage is described. The method provides a means for separating the thermovoltaic effect from the Seebeck effect.
ISSN:1063-7826
1090-6479
DOI:10.1134/S1063782616090116