On the ohmicity of Schottky contacts

The conditions under which Schottky contacts become ohmic are analyzed. Proceeding from classical concepts of the mechanisms of current flow, a generalized Schottky contact model is investigated. This model takes into account the thermionic current of majority charge carriers and the recombination c...

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Veröffentlicht in:Semiconductors (Woodbury, N.Y.) N.Y.), 2016-06, Vol.50 (6), p.761-768
Hauptverfasser: Sachenko, A. V., Belyaev, A. E., Konakova, R. V.
Format: Artikel
Sprache:eng
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Zusammenfassung:The conditions under which Schottky contacts become ohmic are analyzed. Proceeding from classical concepts of the mechanisms of current flow, a generalized Schottky contact model is investigated. This model takes into account the thermionic current of majority charge carriers and the recombination current of minority carriers in Schottky contacts with a dielectric gap. Based on an analysis of the predictions of this model, ohmicity criteria are obtained for Schottky contacts and the conditions for a low injection level and the ohmicity of Si-based Schottky contacts are compared. It is shown that the conditions for Schottky-contact ohmicity do not coincide with those for p – n junctions.
ISSN:1063-7826
1090-6479
DOI:10.1134/S106378261606021X