Temporal resolution limit estimation of x-ray streak cameras using a CsI photocathode
A Monte Carlo model is developed and implemented to calculate the characteristics of x-ray induced secondary electron (SE) emission from a CsI photocathode used in an x-ray streak camera. Time distributions of emitted SEs are investigated with an incident x-ray energy range from 1 to 30 keV and a Cs...
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Veröffentlicht in: | Journal of applied physics 2015-08, Vol.118 (8) |
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Hauptverfasser: | , , , , |
Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | A Monte Carlo model is developed and implemented to calculate the characteristics of x-ray induced secondary electron (SE) emission from a CsI photocathode used in an x-ray streak camera. Time distributions of emitted SEs are investigated with an incident x-ray energy range from 1 to 30 keV and a CsI thickness range from 100 to 1000 nm. Simulation results indicate that SE time distribution curves have little dependence on the incident x-ray energy and CsI thickness. The calculated time dispersion within the CsI photocathode is about 70 fs, which should be the temporal resolution limit of x-ray streak cameras that use CsI as the photocathode material. |
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ISSN: | 0021-8979 1089-7550 |
DOI: | 10.1063/1.4928675 |