Deviation from threshold model in ultrafast laser ablation of graphene at sub-micron scale

We investigate a method to measure ultrafast laser ablation threshold with respect to spot size. We use structured complex beams to generate a pattern of craters in CVD graphene with a single laser pulse. A direct comparison between beam profile and SEM characterization allows us to determine the de...

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Veröffentlicht in:Applied physics letters 2015-08, Vol.107 (6)
Hauptverfasser: Gil-Villalba, A., Xie, C., Salut, R., Furfaro, L., Giust, R., Jacquot, M., Lacourt, P. A., Dudley, J. M., Courvoisier, F.
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Sprache:eng
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Zusammenfassung:We investigate a method to measure ultrafast laser ablation threshold with respect to spot size. We use structured complex beams to generate a pattern of craters in CVD graphene with a single laser pulse. A direct comparison between beam profile and SEM characterization allows us to determine the dependence of ablation probability on spot-size, for crater diameters ranging between 700 nm and 2.5 μm. We report a drastic decrease of ablation probability when the crater diameter is below 1 μm which we interpret in terms of free-carrier diffusion.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.4928391