Characterization of Cr-rich Cr-Sb multilayer films: Syntheses of a new metastable phase using modulated elemental reactants

The new metastable compound Cr1+xSb with x up to 0.6 has been prepared via a thin film approach using modulated elemental reactants and investigated by in-situ X-ray reflectivity, X-ray diffraction, differential scanning calorimetry, energy dispersive X-ray analysis as well as transmission electron...

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Veröffentlicht in:	Journal of solid state chemistry 2015-10, Vol.230, p.254-265
Hauptverfasser:	Regus, Matthias, Mankovsky, Sergiy, Polesya, Svitlana, Kuhn, Gerhard, Ditto, Jeffrey, Schürmann, Ulrich, Jacquot, Alexandre, Bartholomé, Kilian, Näther, Christian, Winkler, Markus, König, Jan D., Böttner, Harald, Kienle, Lorenz, Johnson, David C., Ebert, Hubert, Bensch, Wolfgang
Format:	Artikel
Sprache:	eng
Schlagworte:	ATOMIC FORCE MICROSCOPY CALORIMETRY CRYSTAL GROWTH CRYSTALLIZATION DENSITY OF STATES DFT calculation DIFFUSION ELECTRONIC STRUCTURE In-situ X-ray reflectivity and diffraction INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY Interdiffusion LAYERS MAGNETIC PROPERTIES Metastable phase PHASE STABILITY REFLECTIVITY SYNTHESIS Thin film THIN FILMS TRANSMISSION ELECTRON MICROSCOPY X RADIATION X-RAY DIFFRACTION
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