Characterization of Cr-rich Cr-Sb multilayer films: Syntheses of a new metastable phase using modulated elemental reactants

The new metastable compound Cr1+xSb with x up to 0.6 has been prepared via a thin film approach using modulated elemental reactants and investigated by in-situ X-ray reflectivity, X-ray diffraction, differential scanning calorimetry, energy dispersive X-ray analysis as well as transmission electron...

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Veröffentlicht in:Journal of solid state chemistry 2015-10, Vol.230, p.254-265
Hauptverfasser: Regus, Matthias, Mankovsky, Sergiy, Polesya, Svitlana, Kuhn, Gerhard, Ditto, Jeffrey, Schürmann, Ulrich, Jacquot, Alexandre, Bartholomé, Kilian, Näther, Christian, Winkler, Markus, König, Jan D., Böttner, Harald, Kienle, Lorenz, Johnson, David C., Ebert, Hubert, Bensch, Wolfgang
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Sprache:eng
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Zusammenfassung:The new metastable compound Cr1+xSb with x up to 0.6 has been prepared via a thin film approach using modulated elemental reactants and investigated by in-situ X-ray reflectivity, X-ray diffraction, differential scanning calorimetry, energy dispersive X-ray analysis as well as transmission electron microscopy and atomic force microscopy. The new Cr-rich antimonide crystallizes in a structure related to the Ni2In-type structure, where the crystallographic position (1/3, 2/3, 3/4) is partially occupied by excess Cr. The elemental layers of the pristine material interdiffused significantly before Cr1+xSb crystallized. A change in the activation energy was observed for the diffusion process when crystal growth starts. First-principles electronic structure calculations provide insight into the structural stability, magnetic properties and resistivity of Cr1+xSb. 1 amorphous multilayered film 2 interdiffused amorphous film 3 metastable crystalline phase 4 thermodynamic stable phase (and by-product) [Display omitted] •Interdiffusion of amorphous Cr and Sb occurs before crystallization.•Crystallization of a new metastable phase Cr1.6Sb in Ni2In-type structure.•The new Cr-rich phase shows half-metallic behavior.
ISSN:0022-4596
1095-726X
DOI:10.1016/j.jssc.2015.06.038