Non-destructive single-pass low-noise detection of ions in a beamline

We have conceived, built, and operated a device for the non-destructive single-pass detection of charged particles in a beamline. The detector is based on the non-resonant pick-up and subsequent low-noise amplification of the image charges induced in a cylindrical electrode surrounding the particles...

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Veröffentlicht in:Review of scientific instruments 2015-11, Vol.86 (11), p.113302-113302
Hauptverfasser: Schmidt, Stefan, Murböck, Tobias, Andelkovic, Zoran, Birkl, Gerhard, Nörtershäuser, Wilfried, Stahl, Stefan, Vogel, Manuel
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Sprache:eng
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Zusammenfassung:We have conceived, built, and operated a device for the non-destructive single-pass detection of charged particles in a beamline. The detector is based on the non-resonant pick-up and subsequent low-noise amplification of the image charges induced in a cylindrical electrode surrounding the particles' beam path. The first stage of the amplification electronics is designed to be operated from room temperature down to liquid helium temperature. The device represents a non-destructive charge counter as well as a sensitive timing circuit. We present the concept and design details of the device. We have characterized its performance and show measurements with low-energy highly charged ions (such as Ar(13+)) passing through one of the electrodes of a cylindrical Penning trap. This work demonstrates a novel approach of non-destructive, low noise detection of charged particles which is, depending on the bunch structure, suitable, e.g., for ion traps, low-energy beamlines or accelerator transfer sections.
ISSN:0034-6748
1089-7623
DOI:10.1063/1.4935551