Simultaneous dynamic electrical and structural measurements of functional materials

A new materials characterization system developed at the XMaS beamline, located at the European Synchrotron Radiation Facility in France, is presented. We show that this new capability allows to measure the atomic structural evolution (crystallography) of piezoelectric materials whilst simultaneousl...

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Veröffentlicht in:	Review of scientific instruments 2015-10, Vol.86 (10), p.103901-103901
Hauptverfasser:	Vecchini, C, Thompson, P, Stewart, M, Muñiz-Piniella, A, McMitchell, S R C, Wooldridge, J, Lepadatu, S, Bouchenoire, L, Brown, S, Wermeille, D, Bikondoa, O, Lucas, C A, Hase, T P A, Lesourd, M, Dontsov, D, Cain, M G
Format:	Artikel
Sprache:	eng
Schlagworte:	CRYSTALLOGRAPHY EUROPEAN SYNCHROTRON RADIATION FACILITY INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY MATERIALS MATERIALS SCIENCE PIEZOELECTRICITY Scientific apparatus & instruments STRAINS Synchrotron radiation
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Beschreibung
Zusammenfassung:	A new materials characterization system developed at the XMaS beamline, located at the European Synchrotron Radiation Facility in France, is presented. We show that this new capability allows to measure the atomic structural evolution (crystallography) of piezoelectric materials whilst simultaneously measuring the overall strain characteristics and electrical response to dynamically (ac) applied external stimuli.
ISSN:	0034-6748 1089-7623
DOI:	10.1063/1.4931992