Spherical quartz crystals investigated with synchrotron radiation

The quality of x-ray spectra and images obtained from plasmas with spherically bent crystals depends in part on the crystal’s x-ray diffraction across the entire crystal surface. We employ the energy selectivity and high intensity of synchrotron radiation to examine typical spherical crystals from a...

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Veröffentlicht in:Review of scientific instruments 2015-10, Vol.86 (10)
Hauptverfasser: Pereira, N. R., Macrander, A. T., Hill, K. W., Baronova, E. O., George, K. M., Kotick, J.
Format: Artikel
Sprache:eng
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Zusammenfassung:The quality of x-ray spectra and images obtained from plasmas with spherically bent crystals depends in part on the crystal’s x-ray diffraction across the entire crystal surface. We employ the energy selectivity and high intensity of synchrotron radiation to examine typical spherical crystals from alpha-quartz for their diffraction quality, in a perpendicular geometry that is particularly convenient to examine sagittal focusing. The crystal’s local diffraction is not ideal: the most noticeable problems come from isolated regions that so far have failed to correlate with visible imperfections. Excluding diffraction from such problem spots has little effect on the focus beyond a decrease in background.
ISSN:0034-6748
1089-7623