Coherent diffractive imaging of single layer microspheres

Coherent diffractive imaging of single layer microspheres

We report the extreme ultraviolet (XUV) coherent diffractive imaging of silica/polymer micro-particle samples illuminated by a table-top high harmonic generation source at the wavelength of 30 nm. We achieve images constructed from diffraction patterns acquired with 13 μm × 13 μm samples comprising...

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Veröffentlicht in:Journal of applied physics 2015-04, Vol.117 (16), p.163102
Hauptverfasser: Dinh, Khuong Ba, Ong, Adabelle X. P., Le, Hoang Vu, Henderson, Clare A., Van Vuong, Cuong, Hannaford, Peter, Smith, Trevor A., Van Dao, Lap
Format: Artikel
Sprache:eng
Schlagworte:
Applied physics
CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS
DIFFRACTION
Diffraction patterns
EXTREME ULTRAVIOLET RADIATION
HARMONIC GENERATION
Harmonic generations
Image acquisition
Image reconstruction
MICROSPHERES
PARTICLES
POLYMERS
SILICA
Silicon dioxide
SOFT X RADIATION
Soft x rays
SPHERICAL CONFIGURATION
WAVELENGTHS
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Beschreibung
Zusammenfassung:We report the extreme ultraviolet (XUV) coherent diffractive imaging of silica/polymer micro-particle samples illuminated by a table-top high harmonic generation source at the wavelength of 30 nm. We achieve images constructed from diffraction patterns acquired with 13 μm × 13 μm samples comprising a sparse monolayer of spherical silica and polymer micro-particles. Successful reconstructed image of an aperiodic sample using this HHG source will open the path to the realization of a compact soft x-ray microscope to investigate other complex absorbing samples.
ISSN:0021-8979
1089-7550
DOI:10.1063/1.4919074