Single-charge transport in ambipolar silicon nanoscale field-effect transistors

We report single-charge transport in ambipolar nanoscale MOSFETs, electrostatically defined in near-intrinsic silicon. We use the ambipolarity to demonstrate the confinement of either a few electrons or a few holes in exactly the same crystalline environment underneath a gate electrode. We find simi...

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Veröffentlicht in:Applied physics letters 2015-04, Vol.106 (17)
Hauptverfasser: Mueller, Filipp, Konstantaras, Georgios, van der Wiel, Wilfred G., Zwanenburg, Floris A.
Format: Artikel
Sprache:eng
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Zusammenfassung:We report single-charge transport in ambipolar nanoscale MOSFETs, electrostatically defined in near-intrinsic silicon. We use the ambipolarity to demonstrate the confinement of either a few electrons or a few holes in exactly the same crystalline environment underneath a gate electrode. We find similar electron and hole quantum dot properties while the mobilities differ quantitatively like in microscale devices. The understanding and control of individual electrons and holes are essential for spin-based quantum information processing.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.4919110