Magnetometry of single ferromagnetic nanoparticles using magneto-optical indicator films with spatial amplification

We present a magneto-optical technique to spatially amplify and image fringe fields from single ferromagnetic nanorods. The fringe fields nucleate magnetic domains in a low-coercivity, perpendicularly magnetized indicator film, which are expanded by an applied out-of-plane field from the nanoscale t...

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Veröffentlicht in:Applied physics letters 2015-03, Vol.106 (11)
Hauptverfasser: Balk, Andrew L., Hangarter, Carlos, Stavis, Samuel M., Unguris, John
Format: Artikel
Sprache:eng
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Zusammenfassung:We present a magneto-optical technique to spatially amplify and image fringe fields from single ferromagnetic nanorods. The fringe fields nucleate magnetic domains in a low-coercivity, perpendicularly magnetized indicator film, which are expanded by an applied out-of-plane field from the nanoscale to the microscale for measurement with polar Kerr microscopy. The nucleation location and therefore magnetic orientation of the sample nanorod are detected as spatially dependent field biases in locally measured hysteresis loops of the indicator film. We first discuss our method to fabricate the high-sensitivity indicator film with low energy argon ion irradiation. We then present a map of the amplified signal produced from a single nanorod as measured by the indicator film and compare it with a simultaneously obtained, unamplified fringe field map. The comparison demonstrates the advantage of the amplification mechanism and the capability of the technique to be performed with single-spot magneto-optical Kerr effect magnetometers. Our signal-to-noise ratio determines a minimum measureable particle diameter of tens of nanometers for typical transition metals. We finally use our method to obtain hysteresis loops from multiple nanorods in parallel. Our technique is unperturbed by applied in-plane fields for magnetic manipulation of nanoparticles, is robust against many common noise sources, and is applicable in a variety of test environments. We conclude with a discussion of the future optimization and application of our indicator film technique.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.4916205