Electrical conductivity of reconstructed Si(111) surface with sodium-doped C{sub 60} layers
Electrical conductance of sodium-doped C{sub 60} ultra-thin layers (1–6 monolayers) grown on the Na-adsorbed Si(111)√3 × √3-Au surface has been studied in situ by four-point probe technique, combined with low-energy electron diffraction observations. Evidence of conductance channel formation through...
Gespeichert in:
| Veröffentlicht in: | Applied physics letters 2015-01, Vol.106 (1) |
|---|---|
| Hauptverfasser: | , , , , , , |
| Format: | Artikel |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | 1 |
| container_start_page | |
| container_title | Applied physics letters |
| container_volume | 106 |
| creator | Tsukanov, D. A. Saranin, A. A. School of Natural Sciences, Far Eastern Federal University, Vladivostok 690950 Ryzhkova, M. V. Borisenko, E. A. Zotov, A. V. School of Natural Sciences, Far Eastern Federal University, Vladivostok 690950 Department of Electronics, Vladivostok State University of Economics and Service, Vladivostok 690600 |
| description | Electrical conductance of sodium-doped C{sub 60} ultra-thin layers (1–6 monolayers) grown on the Na-adsorbed Si(111)√3 × √3-Au surface has been studied in situ by four-point probe technique, combined with low-energy electron diffraction observations. Evidence of conductance channel formation through the C{sub 60} ultrathin layer is demonstrated as a result of Na dosing of 3 and 6 monolayers thick C{sub 60} layers. The observed changes in surface conductivity can be attributed to the formation of fulleride-like NaC{sub 60} and Na{sub 2}C{sub 60} compound layers. |
| doi_str_mv | 10.1063/1.4905288 |
| format | Article |
| fullrecord | <record><control><sourceid>osti</sourceid><recordid>TN_cdi_osti_scitechconnect_22395637</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>22395637</sourcerecordid><originalsourceid>FETCH-osti_scitechconnect_223956373</originalsourceid><addsrcrecordid>eNqNjr0KwjAUhYMoWH8G3-CCiw6tuY39m0Vx181BappipBrJTRUR390MPoDT4Xx8cA5jE-QR8lQsMFoWPInzvMMC5FkWCsS8ywLOuQjTIsE-GxBdfE1iIQJ2WDdKOqtl2YA0t6qVTj-0e4GpwSpPyFnPVAU7PUPEOVBr61IqeGp3BjKVbq9hZe7eWL2pPUHKP9CUL2VpxHp12ZAa_3LIppv1frUNDTl9JKmdkmc_cfMPjnEsiiQVmfjP-gJsO0d-</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Electrical conductivity of reconstructed Si(111) surface with sodium-doped C{sub 60} layers</title><source>AIP Journals Complete</source><source>Alma/SFX Local Collection</source><creator>Tsukanov, D. A. ; Saranin, A. A. ; School of Natural Sciences, Far Eastern Federal University, Vladivostok 690950 ; Ryzhkova, M. V. ; Borisenko, E. A. ; Zotov, A. V. ; School of Natural Sciences, Far Eastern Federal University, Vladivostok 690950 ; Department of Electronics, Vladivostok State University of Economics and Service, Vladivostok 690600</creator><creatorcontrib>Tsukanov, D. A. ; Saranin, A. A. ; School of Natural Sciences, Far Eastern Federal University, Vladivostok 690950 ; Ryzhkova, M. V. ; Borisenko, E. A. ; Zotov, A. V. ; School of Natural Sciences, Far Eastern Federal University, Vladivostok 690950 ; Department of Electronics, Vladivostok State University of Economics and Service, Vladivostok 690600</creatorcontrib><description>Electrical conductance of sodium-doped C{sub 60} ultra-thin layers (1–6 monolayers) grown on the Na-adsorbed Si(111)√3 × √3-Au surface has been studied in situ by four-point probe technique, combined with low-energy electron diffraction observations. Evidence of conductance channel formation through the C{sub 60} ultrathin layer is demonstrated as a result of Na dosing of 3 and 6 monolayers thick C{sub 60} layers. The observed changes in surface conductivity can be attributed to the formation of fulleride-like NaC{sub 60} and Na{sub 2}C{sub 60} compound layers.</description><identifier>ISSN: 0003-6951</identifier><identifier>EISSN: 1077-3118</identifier><identifier>DOI: 10.1063/1.4905288</identifier><language>eng</language><publisher>United States</publisher><subject>CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY ; CRYSTAL STRUCTURE ; DOPED MATERIALS ; ELECTRIC CONDUCTIVITY ; ELECTRON DIFFRACTION ; FULLERENES ; GOLD ; LAYERS ; PROBES ; SILICON ; SODIUM ; SURFACES ; THIN FILMS</subject><ispartof>Applied physics letters, 2015-01, Vol.106 (1)</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>230,314,777,781,882,27906,27907</link.rule.ids><backlink>$$Uhttps://www.osti.gov/biblio/22395637$$D View this record in Osti.gov$$Hfree_for_read</backlink></links><search><creatorcontrib>Tsukanov, D. A.</creatorcontrib><creatorcontrib>Saranin, A. A.</creatorcontrib><creatorcontrib>School of Natural Sciences, Far Eastern Federal University, Vladivostok 690950</creatorcontrib><creatorcontrib>Ryzhkova, M. V.</creatorcontrib><creatorcontrib>Borisenko, E. A.</creatorcontrib><creatorcontrib>Zotov, A. V.</creatorcontrib><creatorcontrib>School of Natural Sciences, Far Eastern Federal University, Vladivostok 690950</creatorcontrib><creatorcontrib>Department of Electronics, Vladivostok State University of Economics and Service, Vladivostok 690600</creatorcontrib><title>Electrical conductivity of reconstructed Si(111) surface with sodium-doped C{sub 60} layers</title><title>Applied physics letters</title><description>Electrical conductance of sodium-doped C{sub 60} ultra-thin layers (1–6 monolayers) grown on the Na-adsorbed Si(111)√3 × √3-Au surface has been studied in situ by four-point probe technique, combined with low-energy electron diffraction observations. Evidence of conductance channel formation through the C{sub 60} ultrathin layer is demonstrated as a result of Na dosing of 3 and 6 monolayers thick C{sub 60} layers. The observed changes in surface conductivity can be attributed to the formation of fulleride-like NaC{sub 60} and Na{sub 2}C{sub 60} compound layers.</description><subject>CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY</subject><subject>CRYSTAL STRUCTURE</subject><subject>DOPED MATERIALS</subject><subject>ELECTRIC CONDUCTIVITY</subject><subject>ELECTRON DIFFRACTION</subject><subject>FULLERENES</subject><subject>GOLD</subject><subject>LAYERS</subject><subject>PROBES</subject><subject>SILICON</subject><subject>SODIUM</subject><subject>SURFACES</subject><subject>THIN FILMS</subject><issn>0003-6951</issn><issn>1077-3118</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2015</creationdate><recordtype>article</recordtype><recordid>eNqNjr0KwjAUhYMoWH8G3-CCiw6tuY39m0Vx181BappipBrJTRUR390MPoDT4Xx8cA5jE-QR8lQsMFoWPInzvMMC5FkWCsS8ywLOuQjTIsE-GxBdfE1iIQJ2WDdKOqtl2YA0t6qVTj-0e4GpwSpPyFnPVAU7PUPEOVBr61IqeGp3BjKVbq9hZe7eWL2pPUHKP9CUL2VpxHp12ZAa_3LIppv1frUNDTl9JKmdkmc_cfMPjnEsiiQVmfjP-gJsO0d-</recordid><startdate>20150105</startdate><enddate>20150105</enddate><creator>Tsukanov, D. A.</creator><creator>Saranin, A. A.</creator><creator>School of Natural Sciences, Far Eastern Federal University, Vladivostok 690950</creator><creator>Ryzhkova, M. V.</creator><creator>Borisenko, E. A.</creator><creator>Zotov, A. V.</creator><creator>School of Natural Sciences, Far Eastern Federal University, Vladivostok 690950</creator><creator>Department of Electronics, Vladivostok State University of Economics and Service, Vladivostok 690600</creator><scope>OTOTI</scope></search><sort><creationdate>20150105</creationdate><title>Electrical conductivity of reconstructed Si(111) surface with sodium-doped C{sub 60} layers</title><author>Tsukanov, D. A. ; Saranin, A. A. ; School of Natural Sciences, Far Eastern Federal University, Vladivostok 690950 ; Ryzhkova, M. V. ; Borisenko, E. A. ; Zotov, A. V. ; School of Natural Sciences, Far Eastern Federal University, Vladivostok 690950 ; Department of Electronics, Vladivostok State University of Economics and Service, Vladivostok 690600</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-osti_scitechconnect_223956373</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2015</creationdate><topic>CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY</topic><topic>CRYSTAL STRUCTURE</topic><topic>DOPED MATERIALS</topic><topic>ELECTRIC CONDUCTIVITY</topic><topic>ELECTRON DIFFRACTION</topic><topic>FULLERENES</topic><topic>GOLD</topic><topic>LAYERS</topic><topic>PROBES</topic><topic>SILICON</topic><topic>SODIUM</topic><topic>SURFACES</topic><topic>THIN FILMS</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Tsukanov, D. A.</creatorcontrib><creatorcontrib>Saranin, A. A.</creatorcontrib><creatorcontrib>School of Natural Sciences, Far Eastern Federal University, Vladivostok 690950</creatorcontrib><creatorcontrib>Ryzhkova, M. V.</creatorcontrib><creatorcontrib>Borisenko, E. A.</creatorcontrib><creatorcontrib>Zotov, A. V.</creatorcontrib><creatorcontrib>School of Natural Sciences, Far Eastern Federal University, Vladivostok 690950</creatorcontrib><creatorcontrib>Department of Electronics, Vladivostok State University of Economics and Service, Vladivostok 690600</creatorcontrib><collection>OSTI.GOV</collection><jtitle>Applied physics letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Tsukanov, D. A.</au><au>Saranin, A. A.</au><au>School of Natural Sciences, Far Eastern Federal University, Vladivostok 690950</au><au>Ryzhkova, M. V.</au><au>Borisenko, E. A.</au><au>Zotov, A. V.</au><au>School of Natural Sciences, Far Eastern Federal University, Vladivostok 690950</au><au>Department of Electronics, Vladivostok State University of Economics and Service, Vladivostok 690600</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Electrical conductivity of reconstructed Si(111) surface with sodium-doped C{sub 60} layers</atitle><jtitle>Applied physics letters</jtitle><date>2015-01-05</date><risdate>2015</risdate><volume>106</volume><issue>1</issue><issn>0003-6951</issn><eissn>1077-3118</eissn><abstract>Electrical conductance of sodium-doped C{sub 60} ultra-thin layers (1–6 monolayers) grown on the Na-adsorbed Si(111)√3 × √3-Au surface has been studied in situ by four-point probe technique, combined with low-energy electron diffraction observations. Evidence of conductance channel formation through the C{sub 60} ultrathin layer is demonstrated as a result of Na dosing of 3 and 6 monolayers thick C{sub 60} layers. The observed changes in surface conductivity can be attributed to the formation of fulleride-like NaC{sub 60} and Na{sub 2}C{sub 60} compound layers.</abstract><cop>United States</cop><doi>10.1063/1.4905288</doi></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 0003-6951 |
| ispartof | Applied physics letters, 2015-01, Vol.106 (1) |
| issn | 0003-6951 1077-3118 |
| language | eng |
| recordid | cdi_osti_scitechconnect_22395637 |
| source | AIP Journals Complete; Alma/SFX Local Collection |
| subjects | CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY CRYSTAL STRUCTURE DOPED MATERIALS ELECTRIC CONDUCTIVITY ELECTRON DIFFRACTION FULLERENES GOLD LAYERS PROBES SILICON SODIUM SURFACES THIN FILMS |
| title | Electrical conductivity of reconstructed Si(111) surface with sodium-doped C{sub 60} layers |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-17T11%3A06%3A37IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-osti&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Electrical%20conductivity%20of%20reconstructed%20Si(111)%20surface%20with%20sodium-doped%20C%7Bsub%2060%7D%20layers&rft.jtitle=Applied%20physics%20letters&rft.au=Tsukanov,%20D.%20A.&rft.date=2015-01-05&rft.volume=106&rft.issue=1&rft.issn=0003-6951&rft.eissn=1077-3118&rft_id=info:doi/10.1063/1.4905288&rft_dat=%3Costi%3E22395637%3C/osti%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |