Electrical conductivity of reconstructed Si(111) surface with sodium-doped C{sub 60} layers

Electrical conductance of sodium-doped C{sub 60} ultra-thin layers (1–6 monolayers) grown on the Na-adsorbed Si(111)√3 × √3-Au surface has been studied in situ by four-point probe technique, combined with low-energy electron diffraction observations. Evidence of conductance channel formation through...

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Veröffentlicht in:Applied physics letters 2015-01, Vol.106 (1)
Hauptverfasser: Tsukanov, D. A., Saranin, A. A., School of Natural Sciences, Far Eastern Federal University, Vladivostok 690950, Ryzhkova, M. V., Borisenko, E. A., Zotov, A. V., Department of Electronics, Vladivostok State University of Economics and Service, Vladivostok 690600
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Sprache:eng
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Zusammenfassung:Electrical conductance of sodium-doped C{sub 60} ultra-thin layers (1–6 monolayers) grown on the Na-adsorbed Si(111)√3 × √3-Au surface has been studied in situ by four-point probe technique, combined with low-energy electron diffraction observations. Evidence of conductance channel formation through the C{sub 60} ultrathin layer is demonstrated as a result of Na dosing of 3 and 6 monolayers thick C{sub 60} layers. The observed changes in surface conductivity can be attributed to the formation of fulleride-like NaC{sub 60} and Na{sub 2}C{sub 60} compound layers.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.4905288