The electron-phonon relaxation time in thin superconducting titanium nitride films
We report on the direct measurement of the electron-phonon relaxation time, τeph, in disordered TiN films. Measured values of τeph are from 5.5 ns to 88 ns in the 4.2 to 1.7 K temperature range and consistent with a T−3 temperature dependence. The electronic density of states at the Fermi level N0 i...
Gespeichert in:
| Veröffentlicht in: | Applied physics letters 2013-12, Vol.103 (25) |
|---|---|
| Hauptverfasser: | , , , , , , , , , |
| Format: | Artikel |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | 25 |
| container_start_page | |
| container_title | Applied physics letters |
| container_volume | 103 |
| creator | Kardakova, A. Finkel, M. Morozov, D. Kovalyuk, V. An, P. Dunscombe, C. Tarkhov, M. Mauskopf, P. Klapwijk, T. M. Goltsman, G. |
| description | We report on the direct measurement of the electron-phonon relaxation time, τeph, in disordered TiN films. Measured values of τeph are from 5.5 ns to 88 ns in the 4.2 to 1.7 K temperature range and consistent with a T−3 temperature dependence. The electronic density of states at the Fermi level N0 is estimated from measured material parameters. The presented results confirm that thin TiN films are promising candidate-materials for ultrasensitive superconducting detectors. |
| doi_str_mv | 10.1063/1.4851235 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_osti_</sourceid><recordid>TN_cdi_osti_scitechconnect_22253712</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>1506365049</sourcerecordid><originalsourceid>FETCH-LOGICAL-c353t-c9c3bc885d5fd06dc9eb1129ad7d6692e9e92bb92211a3c505b5ed3dc0adfb5a3</originalsourceid><addsrcrecordid>eNpFUU1LxDAQDaLgunrwHxS86KFrPjZtcxTxCxYEWc8hTaY2S5vUJAX990Z20cu8GebxmHkPoUuCVwRX7Jas1g0nlPEjtCC4rktGSHOMFhhjVlaCk1N0FuMuj5wytkBv2x4KGECn4F059d55VwQY1JdKNrfJjlDYjH0ucZ4gaO_MrJN1H3mZlLPzWDibgjVQdHYY4zk66dQQ4eKAS_T--LC9fy43r08v93ebUjPOUqmFZq1uGm54Z3BltICWECqUqU1VCQoCBG1bQSkhimmOecvBMKOxMl3LFVuiq72uj8nKqG0C3efrXH5GUko5q7MRS3S9Z03Bf84Qkxxt1DAMyoGfoyQ821ZxvBb_gn_UnZ-Dyz9ISmhdV1VDcWbd7Fk6-BgDdHIKdlThWxIsfzOQRB4yYD9zInjb</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2127766820</pqid></control><display><type>article</type><title>The electron-phonon relaxation time in thin superconducting titanium nitride films</title><source>AIP Journals Complete</source><source>AIP Digital Archive</source><source>Alma/SFX Local Collection</source><creator>Kardakova, A. ; Finkel, M. ; Morozov, D. ; Kovalyuk, V. ; An, P. ; Dunscombe, C. ; Tarkhov, M. ; Mauskopf, P. ; Klapwijk, T. M. ; Goltsman, G.</creator><creatorcontrib>Kardakova, A. ; Finkel, M. ; Morozov, D. ; Kovalyuk, V. ; An, P. ; Dunscombe, C. ; Tarkhov, M. ; Mauskopf, P. ; Klapwijk, T. M. ; Goltsman, G.</creatorcontrib><description>We report on the direct measurement of the electron-phonon relaxation time, τeph, in disordered TiN films. Measured values of τeph are from 5.5 ns to 88 ns in the 4.2 to 1.7 K temperature range and consistent with a T−3 temperature dependence. The electronic density of states at the Fermi level N0 is estimated from measured material parameters. The presented results confirm that thin TiN films are promising candidate-materials for ultrasensitive superconducting detectors.</description><identifier>ISSN: 0003-6951</identifier><identifier>EISSN: 1077-3118</identifier><identifier>DOI: 10.1063/1.4851235</identifier><language>eng</language><publisher>Melville: American Institute of Physics</publisher><subject>Applied physics ; CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY ; Detectors ; ELECTRONS ; FERMI LEVEL ; Parameter estimation ; PHONONS ; RELAXATION TIME ; Superconductivity ; TEMPERATURE DEPENDENCE ; TEMPERATURE RANGE ; Thin films ; TITANIUM ; Titanium nitride ; TITANIUM NITRIDES</subject><ispartof>Applied physics letters, 2013-12, Vol.103 (25)</ispartof><rights>2013 AIP Publishing LLC.</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c353t-c9c3bc885d5fd06dc9eb1129ad7d6692e9e92bb92211a3c505b5ed3dc0adfb5a3</citedby><cites>FETCH-LOGICAL-c353t-c9c3bc885d5fd06dc9eb1129ad7d6692e9e92bb92211a3c505b5ed3dc0adfb5a3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>230,315,782,786,887,27931,27932</link.rule.ids><backlink>$$Uhttps://www.osti.gov/biblio/22253712$$D View this record in Osti.gov$$Hfree_for_read</backlink></links><search><creatorcontrib>Kardakova, A.</creatorcontrib><creatorcontrib>Finkel, M.</creatorcontrib><creatorcontrib>Morozov, D.</creatorcontrib><creatorcontrib>Kovalyuk, V.</creatorcontrib><creatorcontrib>An, P.</creatorcontrib><creatorcontrib>Dunscombe, C.</creatorcontrib><creatorcontrib>Tarkhov, M.</creatorcontrib><creatorcontrib>Mauskopf, P.</creatorcontrib><creatorcontrib>Klapwijk, T. M.</creatorcontrib><creatorcontrib>Goltsman, G.</creatorcontrib><title>The electron-phonon relaxation time in thin superconducting titanium nitride films</title><title>Applied physics letters</title><description>We report on the direct measurement of the electron-phonon relaxation time, τeph, in disordered TiN films. Measured values of τeph are from 5.5 ns to 88 ns in the 4.2 to 1.7 K temperature range and consistent with a T−3 temperature dependence. The electronic density of states at the Fermi level N0 is estimated from measured material parameters. The presented results confirm that thin TiN films are promising candidate-materials for ultrasensitive superconducting detectors.</description><subject>Applied physics</subject><subject>CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY</subject><subject>Detectors</subject><subject>ELECTRONS</subject><subject>FERMI LEVEL</subject><subject>Parameter estimation</subject><subject>PHONONS</subject><subject>RELAXATION TIME</subject><subject>Superconductivity</subject><subject>TEMPERATURE DEPENDENCE</subject><subject>TEMPERATURE RANGE</subject><subject>Thin films</subject><subject>TITANIUM</subject><subject>Titanium nitride</subject><subject>TITANIUM NITRIDES</subject><issn>0003-6951</issn><issn>1077-3118</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2013</creationdate><recordtype>article</recordtype><recordid>eNpFUU1LxDAQDaLgunrwHxS86KFrPjZtcxTxCxYEWc8hTaY2S5vUJAX990Z20cu8GebxmHkPoUuCVwRX7Jas1g0nlPEjtCC4rktGSHOMFhhjVlaCk1N0FuMuj5wytkBv2x4KGECn4F059d55VwQY1JdKNrfJjlDYjH0ucZ4gaO_MrJN1H3mZlLPzWDibgjVQdHYY4zk66dQQ4eKAS_T--LC9fy43r08v93ebUjPOUqmFZq1uGm54Z3BltICWECqUqU1VCQoCBG1bQSkhimmOecvBMKOxMl3LFVuiq72uj8nKqG0C3efrXH5GUko5q7MRS3S9Z03Bf84Qkxxt1DAMyoGfoyQ821ZxvBb_gn_UnZ-Dyz9ISmhdV1VDcWbd7Fk6-BgDdHIKdlThWxIsfzOQRB4yYD9zInjb</recordid><startdate>20131216</startdate><enddate>20131216</enddate><creator>Kardakova, A.</creator><creator>Finkel, M.</creator><creator>Morozov, D.</creator><creator>Kovalyuk, V.</creator><creator>An, P.</creator><creator>Dunscombe, C.</creator><creator>Tarkhov, M.</creator><creator>Mauskopf, P.</creator><creator>Klapwijk, T. M.</creator><creator>Goltsman, G.</creator><general>American Institute of Physics</general><scope>AAYXX</scope><scope>CITATION</scope><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope><scope>7QQ</scope><scope>7U5</scope><scope>JG9</scope><scope>OTOTI</scope></search><sort><creationdate>20131216</creationdate><title>The electron-phonon relaxation time in thin superconducting titanium nitride films</title><author>Kardakova, A. ; Finkel, M. ; Morozov, D. ; Kovalyuk, V. ; An, P. ; Dunscombe, C. ; Tarkhov, M. ; Mauskopf, P. ; Klapwijk, T. M. ; Goltsman, G.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c353t-c9c3bc885d5fd06dc9eb1129ad7d6692e9e92bb92211a3c505b5ed3dc0adfb5a3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2013</creationdate><topic>Applied physics</topic><topic>CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY</topic><topic>Detectors</topic><topic>ELECTRONS</topic><topic>FERMI LEVEL</topic><topic>Parameter estimation</topic><topic>PHONONS</topic><topic>RELAXATION TIME</topic><topic>Superconductivity</topic><topic>TEMPERATURE DEPENDENCE</topic><topic>TEMPERATURE RANGE</topic><topic>Thin films</topic><topic>TITANIUM</topic><topic>Titanium nitride</topic><topic>TITANIUM NITRIDES</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Kardakova, A.</creatorcontrib><creatorcontrib>Finkel, M.</creatorcontrib><creatorcontrib>Morozov, D.</creatorcontrib><creatorcontrib>Kovalyuk, V.</creatorcontrib><creatorcontrib>An, P.</creatorcontrib><creatorcontrib>Dunscombe, C.</creatorcontrib><creatorcontrib>Tarkhov, M.</creatorcontrib><creatorcontrib>Mauskopf, P.</creatorcontrib><creatorcontrib>Klapwijk, T. M.</creatorcontrib><creatorcontrib>Goltsman, G.</creatorcontrib><collection>CrossRef</collection><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Ceramic Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Materials Research Database</collection><collection>OSTI.GOV</collection><jtitle>Applied physics letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Kardakova, A.</au><au>Finkel, M.</au><au>Morozov, D.</au><au>Kovalyuk, V.</au><au>An, P.</au><au>Dunscombe, C.</au><au>Tarkhov, M.</au><au>Mauskopf, P.</au><au>Klapwijk, T. M.</au><au>Goltsman, G.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>The electron-phonon relaxation time in thin superconducting titanium nitride films</atitle><jtitle>Applied physics letters</jtitle><date>2013-12-16</date><risdate>2013</risdate><volume>103</volume><issue>25</issue><issn>0003-6951</issn><eissn>1077-3118</eissn><abstract>We report on the direct measurement of the electron-phonon relaxation time, τeph, in disordered TiN films. Measured values of τeph are from 5.5 ns to 88 ns in the 4.2 to 1.7 K temperature range and consistent with a T−3 temperature dependence. The electronic density of states at the Fermi level N0 is estimated from measured material parameters. The presented results confirm that thin TiN films are promising candidate-materials for ultrasensitive superconducting detectors.</abstract><cop>Melville</cop><pub>American Institute of Physics</pub><doi>10.1063/1.4851235</doi><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 0003-6951 |
| ispartof | Applied physics letters, 2013-12, Vol.103 (25) |
| issn | 0003-6951 1077-3118 |
| language | eng |
| recordid | cdi_osti_scitechconnect_22253712 |
| source | AIP Journals Complete; AIP Digital Archive; Alma/SFX Local Collection |
| subjects | Applied physics CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY Detectors ELECTRONS FERMI LEVEL Parameter estimation PHONONS RELAXATION TIME Superconductivity TEMPERATURE DEPENDENCE TEMPERATURE RANGE Thin films TITANIUM Titanium nitride TITANIUM NITRIDES |
| title | The electron-phonon relaxation time in thin superconducting titanium nitride films |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-04T16%3A26%3A39IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_osti_&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=The%20electron-phonon%20relaxation%20time%20in%20thin%20superconducting%20titanium%20nitride%20films&rft.jtitle=Applied%20physics%20letters&rft.au=Kardakova,%20A.&rft.date=2013-12-16&rft.volume=103&rft.issue=25&rft.issn=0003-6951&rft.eissn=1077-3118&rft_id=info:doi/10.1063/1.4851235&rft_dat=%3Cproquest_osti_%3E1506365049%3C/proquest_osti_%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=2127766820&rft_id=info:pmid/&rfr_iscdi=true |