Formation of multi-charged ion beams by focusing effect of mid-electrode on electron cyclotron resonance ion source
We are constructing a tandem type electron cyclotron resonance ion source (ECRIS) and a beam line for extracting ion beams. The ion beam is extracted from the second stage by an accel-decel extraction system with a single-hole and the ion beam current on each electrode is measured. The total ion bea...
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Veröffentlicht in: | Review of scientific instruments 2014-02, Vol.85 (2), p.02A955-02A955 |
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Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | We are constructing a tandem type electron cyclotron resonance ion source (ECRIS) and a beam line for extracting ion beams. The ion beam is extracted from the second stage by an accel-decel extraction system with a single-hole and the ion beam current on each electrode is measured. The total ion beam current is measured by a faraday cup downstream the extraction electrodes. We measure these currents as a function of the mid-electrode potential. We also change the gap length between electrodes and perform similar measurement. The behaviors of these currents obtained experimentally against the mid-electrode potential show qualitatively good agreement with a simple theoretical consideration including sheath potential effects. The effect of mid-electrode potential is very useful for decreasing the beam loss for enhancing ion beam current extracted from ECRIS. |
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ISSN: | 0034-6748 1089-7623 |
DOI: | 10.1063/1.4861401 |