Formation of multi-charged ion beams by focusing effect of mid-electrode on electron cyclotron resonance ion source

We are constructing a tandem type electron cyclotron resonance ion source (ECRIS) and a beam line for extracting ion beams. The ion beam is extracted from the second stage by an accel-decel extraction system with a single-hole and the ion beam current on each electrode is measured. The total ion bea...

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Veröffentlicht in:Review of scientific instruments 2014-02, Vol.85 (2), p.02A955-02A955
Hauptverfasser: Imai, Youta, Kimura, Daiju, Kurisu, Yosuke, Nozaki, Dai, Yano, Keisuke, Kumakura, Sho, Sato, Fuminobu, Kato, Yushi, Iida, Toshiyuki
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Sprache:eng
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Zusammenfassung:We are constructing a tandem type electron cyclotron resonance ion source (ECRIS) and a beam line for extracting ion beams. The ion beam is extracted from the second stage by an accel-decel extraction system with a single-hole and the ion beam current on each electrode is measured. The total ion beam current is measured by a faraday cup downstream the extraction electrodes. We measure these currents as a function of the mid-electrode potential. We also change the gap length between electrodes and perform similar measurement. The behaviors of these currents obtained experimentally against the mid-electrode potential show qualitatively good agreement with a simple theoretical consideration including sheath potential effects. The effect of mid-electrode potential is very useful for decreasing the beam loss for enhancing ion beam current extracted from ECRIS.
ISSN:0034-6748
1089-7623
DOI:10.1063/1.4861401