Positron annihilation spectroscopy techniques applied to the study of an HPGe detector

Doppler Broadening Spectroscopy of the large Ge crystal of an HPGe detector was performed using positrons from pair production of 6.13 MeV {gamma}-rays from the {sup 19}F(p,{alpha}{gamma}){sup 16}O reaction. Two HPGe detectors facing opposite sides of the Ge crystal acting as target provided both coincidence and singles spectra. Changes in the shape of the annihilation peak were observed when the high voltage applied to the target detector was switched on or off, amounting to somewhat less than 20% when the areas of equivalent energy intervals in the corresponding normalized spectra are compared.