Spatially resolved high-resolution x-ray spectroscopy of high-current plasma-focus discharges

Soft x-ray emission from a Mather-type plasma-focus device (PF-1000) operated at ∼ 400 kJ was measured. The high density and temperature plasma were generated by the discharge in the deuterium-argon gas mixture in the modified (high-current) plasma-focus configuration. A spherically bent mica crys...

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Veröffentlicht in:	Review of scientific instruments 2010-10, Vol.81 (10), p.10E312-10E312-3
Hauptverfasser:	Zając, S., Rzadkiewicz, J., Rosmej, O., Scholz, M., Yongtao, Zhao, Gójska, A., Paduch, M., Zielińska, E.
Format:	Artikel
Sprache:	eng
Schlagworte:	70 PLASMA PHYSICS AND FUSION TECHNOLOGY ARGON CRYSTALS DEUTERIUM ELECTRIC DISCHARGES HOT PLASMA INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY MICA PF-1000 DEVICE PINCH EFFECT PLASMA DENSITY PLASMA FOCUS SOFT X RADIATION SPATIAL RESOLUTION X-RAY EMISSION ANALYSIS X-RAY SPECTRA X-RAY SPECTROSCOPY
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Zusammenfassung:	Soft x-ray emission from a Mather-type plasma-focus device (PF-1000) operated at ∼ 400 kJ was measured. The high density and temperature plasma were generated by the discharge in the deuterium-argon gas mixture in the modified (high-current) plasma-focus configuration. A spherically bent mica crystal spectrograph viewing the axial output of the pinch region was used to measure the x-ray spectra. Spatially resolved spectra including the characteristic x-ray lines of highly ionized Ar and continua were recorded by means of an x-ray film. The x-ray emission of PF-1000 device was studied at different areas of the pinch.
ISSN:	0034-6748 1089-7623
DOI:	10.1063/1.3483190