Tailoring interfacial exchange coupling with low-energy ion beam bombardment: Tuning the interface roughness

By ascertaining NiO surface roughness in a Ni 80 Fe 20 /NiO film system, we were able to correlate the effects of altered interface roughness from low-energy ion-beam bombardment of the NiO layer and the different thermal instabilities in the NiO nanocrystallites. From experiment and by modelling th...

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Veröffentlicht in:Applied physics letters 2012-03, Vol.100 (12), p.122409-122409-4
Hauptverfasser: Lin, K.-W., Mirza, M., Shueh, C., Huang, H.-R., Hsu, H.-F., Lierop, J. van
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Sprache:eng
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Zusammenfassung:By ascertaining NiO surface roughness in a Ni 80 Fe 20 /NiO film system, we were able to correlate the effects of altered interface roughness from low-energy ion-beam bombardment of the NiO layer and the different thermal instabilities in the NiO nanocrystallites. From experiment and by modelling the temperature dependence of the exchange bias field and coercivity, we have found that reducing the interface roughness and changing the interface texture from an irregular to striped conformation enhanced the exchange coupling strength. Our results were in good agreement with recent simulations using the domain state model that incorporated interface mixing.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.3697405