The effect of morphology and surface composition on radiation resistance of heterogeneous material CdS-PbS

As a result of a complex study of the heterophase photosensitive material CdS-PbS by the methods of scanning electron microscopy and Auger spectrometry, it has been found that the radiation resistance of this material depends on the morphology and phase composition at its surface. It is shown that,...

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Veröffentlicht in:	Semiconductors (Woodbury, N.Y.) N.Y.), 2011-07, Vol.45 (7), p.888-893
Hauptverfasser:	Malyar, I. V., Stetsyura, S. V.
Format:	Artikel
Sprache:	eng
Schlagworte:	AGGLOMERATION CADMIUM SULFIDES Interfaces LAYERS LEAD SULFIDES Magnetic Materials Magnetism MATERIALS SCIENCE MORPHOLOGY Nuclear radiation OXYGEN Physics Physics and Astronomy Public television SCANNING ELECTRON MICROSCOPY SPECTROSCOPY Sulfur compounds SURFACES Thin Films
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