Publisher’s Note: “X-ray photoelectron spectroscopy study of the chemical interaction at the Pd/SiC interface” [J. Appl. Phys. 108, 093702 (2010)]
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| Veröffentlicht in: | Journal of applied physics 2011-01, Vol.109 (2) |
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| container_issue | 2 |
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| container_title | Journal of applied physics |
| container_volume | 109 |
| creator | Zhang, Y. Gajjala, G. Hofmann, T. Weinhardt, L. Bär, M. Heske, C. Seelmann-Eggebert, M. Meisen, P. |
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| doi_str_mv | 10.1063/1.3532951 |
| format | Article |
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| fulltext | fulltext |
| identifier | ISSN: 0021-8979 |
| ispartof | Journal of applied physics, 2011-01, Vol.109 (2) |
| issn | 0021-8979 1089-7550 |
| language | eng |
| recordid | cdi_osti_scitechconnect_21538054 |
| source | AIP Journals Complete; AIP Digital Archive; Alma/SFX Local Collection |
| subjects | CARBIDES CARBON COMPOUNDS CHEMICAL BONDS CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY ELECTRON SPECTROSCOPY ELEMENTS INTERACTIONS INTERFACES MATERIALS SCIENCE METALS PALLADIUM PHOTOELECTRON SPECTROSCOPY PLATINUM METALS SILICON CARBIDES SILICON COMPOUNDS SPECTROSCOPY TRANSITION ELEMENTS X-RAY PHOTOELECTRON SPECTROSCOPY |
| title | Publisher’s Note: “X-ray photoelectron spectroscopy study of the chemical interaction at the Pd/SiC interface” [J. Appl. Phys. 108, 093702 (2010)] |
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