Effect of biphase on dielectric properties of Bi-doped lead strontium titanate thin films

Pb 0.4Sr 0.6TiO 3 (PST) thin films doped with various concentration of Bi were prepared by a sol–gel method. The phase status, surface morphology and dielectric properties of these thin films were measured by X-ray diffraction (XRD), scanning electron microscopy (SEM) and impedance analyzer, respect...

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Veröffentlicht in:	Journal of solid state chemistry 2010-11, Vol.183 (11), p.2598-2601
Hauptverfasser:	Li, X.T., Du, P.Y., Zhao, Y.L., Tu, Y., Dai, J.L., Weng, W.J., Han, G.R., Song, C.L.
Format:	Artikel
Sprache:	eng
Schlagworte:	ALKALINE EARTH METAL COMPOUNDS Biphase BISMUTH COHERENT SCATTERING Condensed matter: electronic structure, electrical, magnetic, and optical properties Dielectric constant DIELECTRIC MATERIALS DIELECTRIC PROPERTIES Dielectric thin films Dielectrics, piezoelectrics, and ferroelectrics and their properties DIFFRACTION DOPED MATERIALS ELECTRICAL PROPERTIES ELECTRON MICROSCOPY ELEMENTS Exact sciences and technology IMPEDANCE LEAD COMPOUNDS MATERIALS MATERIALS SCIENCE METALS MICROSCOPY MINERALS MORPHOLOGY OXIDE MINERALS OXYGEN COMPOUNDS PERMITTIVITY PEROVSKITE PEROVSKITES PHYSICAL PROPERTIES Physics PST PYROCHLORE Pyrochlores SCANNING ELECTRON MICROSCOPY SCATTERING SOL-GEL PROCESS Sol–gel processes STRONTIUM COMPOUNDS STRONTIUM TITANATES THIN FILMS TITANATES TITANIUM COMPOUNDS TRANSITION ELEMENT COMPOUNDS X-RAY DIFFRACTION X-rays
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Zusammenfassung:	Pb 0.4Sr 0.6TiO 3 (PST) thin films doped with various concentration of Bi were prepared by a sol–gel method. The phase status, surface morphology and dielectric properties of these thin films were measured by X-ray diffraction (XRD), scanning electron microscopy (SEM) and impedance analyzer, respectively. Results showed that the thin films with the maximum dielectric constant and minimum dielectric loss were obtained for x=0.15. For x
ISSN:	0022-4596 1095-726X
DOI:	10.1016/j.jssc.2010.09.007