Specific features of the epitaxial growth of narrow-gap InSb quantum dots on an InAs substrate
Arrays of coherent InSb quantum dots (QDs) have been fabricated by liquid-phase epitaxy on InAs substrates in the temperature range T = 420–450°C. The QDs with a density of (0.9−2) × 10 10 cm −2 were 3 nm high and 13 nm in diameter. A bimodal QD size distribution was observed, which was accounted fo...
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Veröffentlicht in: | Semiconductors (Woodbury, N.Y.) N.Y.), 2009-08, Vol.43 (8), p.1102-1109 |
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Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | Arrays of coherent InSb quantum dots (QDs) have been fabricated by liquid-phase epitaxy on InAs substrates in the temperature range
T
= 420–450°C. The QDs with a density of (0.9−2) × 10
10
cm
−2
were 3 nm high and 13 nm in diameter. A bimodal QD size distribution was observed, which was accounted for by a combined growth mechanism of these nanoobjects. Structural characteristics of a separate InSb QD formed on the InAs surface were studied for the first time by atomic-force and transmission electron microscopies. Moire fringes were observed for the first time for QDs in the InSb/InAs system, with the moire period of 3.5 nm corresponding to InSb QDs without an admixture of arsenic. |
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ISSN: | 1063-7826 1090-6479 |
DOI: | 10.1134/S1063782609080259 |