Cross section measurements of high-p{sub T} dilepton final-state processes using a global fitting method

We present a new method for studying high-p{sub T} dilepton events (e{sup {+-}}e{sup {+-}}, {mu}{sup {+-}}{mu}{sup {+-}}, e{sup {+-}}{mu}{sup {+-}}) and simultaneously extracting the production cross sections of pp{yields}tt, pp{yields}W{sup +}W{sup -}, and pp{yields}Z{sup 0}{yields}{tau}{sup +}{tau}{sup -} at a center-of-mass energy of {radical}(s)=1.96 TeV. We perform a likelihood fit to the dilepton data in a parameter space defined by the missing transverse energy and the number of jets in the event. Our results, which use 360 pb{sup -1} of data recorded with the CDF II detector at the Fermilab Tevatron Collider, are {sigma}(tt)=8.5{sub -2.2}{sup +2.7} pb, {sigma}(W{sup +}W{sup -})=16.3{sub -4.4}{sup +5.2} pb, and {sigma}(Z{sup 0}{yields}{tau}{sup +}{tau}{sup -})=291{sub -46}{sup +50} pb.