Hard-x-ray microscopy with Fresnel zone plates reaches 40 nm Rayleigh resolution

Substantial improvements in the nanofabrication and characteristics of gold Fresnel zone plates yielded unprecedented resolution levels in hard-x-ray microscopy. Tests performed on a variety of specimens with 8 - 10 keV photons demonstrated a first-order lateral resolution below 40 nm based on the R...

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Veröffentlicht in:	Applied physics letters 2008-03, Vol.92 (10), p.103119-103119-3
Hauptverfasser:	Chu, Y. S., Yi, J. M., De Carlo, F., Shen, Q., Lee, Wah-Keat, Wu, H. J., Wang, C. L., Wang, J. Y., Liu, C. J., Wang, C. H., Wu, S. R., Chien, C. C., Hwu, Y., Tkachuk, A., Yun, W., Feser, M., Liang, K. S., Yang, C. S., Je, J. H., Margaritondo, G.
Format:	Artikel
Sprache:	eng
Schlagworte:	CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS DIFFRACTION FABRICATION FRESNEL LENS GOLD HARD X RADIATION KEV RANGE 01-10 MICROSCOPY NANOSTRUCTURES PHOTONS PLATES RAYLEIGH SCATTERING RESOLUTION
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