Photoelectric effect at ultrahigh intensities

In the spectral range of the extreme ultraviolet at a wavelength of 13.3 nm, we have studied the photoionization of xenon at ultrahigh intensities. For our ion mass-to-charge spectroscopy experiments, irradiance levels from 10(12) to 10(16) W cm(-2) were achieved at the new free-electron laser in Ha...

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Veröffentlicht in:	Physical review letters 2007-11, Vol.99 (21), p.213002-213002, Article 213002
Hauptverfasser:	Sorokin, A A, Bobashev, S V, Feigl, T, Tiedtke, K, Wabnitz, H, Richter, M
Format:	Artikel
Sprache:	eng
Schlagworte:	ATOMIC AND MOLECULAR PHYSICS EXTREME ULTRAVIOLET RADIATION FREE ELECTRON LASERS MASS SPECTROSCOPY MULTICHARGED IONS PHOTOELECTRIC EFFECT PHOTOIONIZATION RADIANT FLUX DENSITY SPHERICAL CONFIGURATION XENON XENON IONS
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