Photoelectric effect at ultrahigh intensities

Photoelectric effect at ultrahigh intensities

In the spectral range of the extreme ultraviolet at a wavelength of 13.3 nm, we have studied the photoionization of xenon at ultrahigh intensities. For our ion mass-to-charge spectroscopy experiments, irradiance levels from 10(12) to 10(16) W cm(-2) were achieved at the new free-electron laser in Ha...

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Veröffentlicht in:Physical review letters 2007-11, Vol.99 (21), p.213002-213002, Article 213002
Hauptverfasser: Sorokin, A A, Bobashev, S V, Feigl, T, Tiedtke, K, Wabnitz, H, Richter, M
Format: Artikel
Sprache:eng
Schlagworte:
ATOMIC AND MOLECULAR PHYSICS
EXTREME ULTRAVIOLET RADIATION
FREE ELECTRON LASERS
MASS SPECTROSCOPY
MULTICHARGED IONS
PHOTOELECTRIC EFFECT
PHOTOIONIZATION
RADIANT FLUX DENSITY
SPHERICAL CONFIGURATION
XENON
XENON IONS
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Zusammenfassung:In the spectral range of the extreme ultraviolet at a wavelength of 13.3 nm, we have studied the photoionization of xenon at ultrahigh intensities. For our ion mass-to-charge spectroscopy experiments, irradiance levels from 10(12) to 10(16) W cm(-2) were achieved at the new free-electron laser in Hamburg FLASH by strong beam focusing with the aid of a spherical multilayer mirror. Ion charges up to Xe21+ were observed and investigated as a function of irradiance. Our surprising results are discussed in terms of a perturbative and nonperturbative description.
ISSN:0031-9007
1079-7114
DOI:10.1103/physrevlett.99.213002