Design and performance of a curved-crystal x-ray emission spectrometer

A curved-crystal x-ray emission spectrometer has been designed and built to measure 2 - 5 keV x-ray fluorescence resulting from a core-level excitation of gas phase species. The spectrometer can rotate 180°, allowing detection of emitted x rays with variable polarization angles, and is capable of co...

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Veröffentlicht in:	Review of scientific instruments 2007-05, Vol.78 (5), p.053101-053101-5
Hauptverfasser:	Hudson, A. C., Stolte, W. C., Lindle, D. W., Guillemin, R.
Format:	Artikel
Sprache:	eng
Schlagworte:	ANGULAR DISTRIBUTION CRYSTALS DESIGN EMISSION SPECTRA Equipment Design Equipment Failure Analysis EXCITATION FLUORESCENCE INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY KEV RANGE 01-10 POLARIZATION Refractometry - instrumentation Refractometry - methods Reproducibility of Results Sensitivity and Specificity Spectrometry, X-Ray Emission - instrumentation Spectrometry, X-Ray Emission - methods X RADIATION X-RAY DETECTION X-RAY SPECTRA X-RAY SPECTROMETERS
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Beschreibung
Zusammenfassung:	A curved-crystal x-ray emission spectrometer has been designed and built to measure 2 - 5 keV x-ray fluorescence resulting from a core-level excitation of gas phase species. The spectrometer can rotate 180°, allowing detection of emitted x rays with variable polarization angles, and is capable of collecting spectra over a wide energy range ( 20 eV wide with 0.5 eV resolution at the Cl K edge) simultaneously. In addition, the entire experimental chamber can be rotated about the incident-radiation axis by nearly 360° while maintaining vacuum, permitting measurements of angular distributions of emitted x rays.
ISSN:	0034-6748 1089-7623
DOI:	10.1063/1.2735933