UCLA/FNPL Underdense Plasma Lens Experiment: Results and Analysis
Focusing of a 15 MeV, 16 nC electron bunch by a gaussian underdense plasma lens operated just beyond the threshold of the underdense condition has been demonstrated. The strong 1.9 cm focal length plasma lens focused both transverse directions simultaneously and reduced the minimum area of the beam...
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Veröffentlicht in: | AIP conference proceedings 2006-11, Vol.877 (1) |
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creator | Thompson, M. C. UCLA Department of Physics and Astronomy, Los Angeles, California, 90095 Badakov, H. Rosenzweig, J. B. Travish, G. Fliller, R. Kazakevich, G. M. Piot, P. Santucci, J. Li, J. Tikhoplav, R. |
description | Focusing of a 15 MeV, 16 nC electron bunch by a gaussian underdense plasma lens operated just beyond the threshold of the underdense condition has been demonstrated. The strong 1.9 cm focal length plasma lens focused both transverse directions simultaneously and reduced the minimum area of the beam spot by a factor of 23. Analysis of the beam envelope evolution observed near the beam waist shows that the spherical aberrations of this underdense lens are lower than those of an overdense plasma lens, as predicted by theory. Time resolved measurements of the focused electron bunch are also reported and compared to simulations. |
doi_str_mv | 10.1063/1.2409184 |
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subjects | BEAM BUNCHING BEAM-PLASMA SYSTEMS ELECTROMAGNETIC LENSES ELECTRON BEAMS FOCUSING GEOMETRICAL ABERRATIONS MEV RANGE 10-100 PARTICLE ACCELERATORS SIMULATION TIME RESOLUTION UCLA |
title | UCLA/FNPL Underdense Plasma Lens Experiment: Results and Analysis |
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