UCLA/FNPL Underdense Plasma Lens Experiment: Results and Analysis

UCLA/FNPL Underdense Plasma Lens Experiment: Results and Analysis

Focusing of a 15 MeV, 16 nC electron bunch by a gaussian underdense plasma lens operated just beyond the threshold of the underdense condition has been demonstrated. The strong 1.9 cm focal length plasma lens focused both transverse directions simultaneously and reduced the minimum area of the beam...

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Veröffentlicht in:AIP conference proceedings 2006-11, Vol.877 (1)
Hauptverfasser: Thompson, M. C., UCLA Department of Physics and Astronomy, Los Angeles, California, 90095, Badakov, H., Rosenzweig, J. B., Travish, G., Fliller, R., Kazakevich, G. M., Piot, P., Santucci, J., Li, J., Tikhoplav, R.
Format: Artikel
Sprache:eng
Schlagworte:
BEAM BUNCHING
BEAM-PLASMA SYSTEMS
ELECTROMAGNETIC LENSES
ELECTRON BEAMS
FOCUSING
GEOMETRICAL ABERRATIONS
MEV RANGE 10-100
PARTICLE ACCELERATORS
SIMULATION
TIME RESOLUTION
UCLA
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Beschreibung
Zusammenfassung:Focusing of a 15 MeV, 16 nC electron bunch by a gaussian underdense plasma lens operated just beyond the threshold of the underdense condition has been demonstrated. The strong 1.9 cm focal length plasma lens focused both transverse directions simultaneously and reduced the minimum area of the beam spot by a factor of 23. Analysis of the beam envelope evolution observed near the beam waist shows that the spherical aberrations of this underdense lens are lower than those of an overdense plasma lens, as predicted by theory. Time resolved measurements of the focused electron bunch are also reported and compared to simulations.
ISSN:0094-243X
1551-7616
DOI:10.1063/1.2409184