Cantilever's behavior in the AC mode of an AFM

Cantilever's behavior in the AC mode of an AFM

In this paper, a model with a small number of parameters is used to simulate the motion of a cantilever in the AC mode of an atomic force microscope (AFM). The results elucidate the transition dependence—from noncontact to tapping operating mode—on the height of the contamination layer and on the st...

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Veröffentlicht in:Materials characterization 2003-03, Vol.50 (2), p.173-177
Hauptverfasser: Nunes, V.B., Zanette, S.I., Caride, A.O., Prioli, R., Rivas, A.M.F.
Format: Artikel
Sprache:eng
Schlagworte:
AFM
ATOMIC FORCE MICROSCOPY
CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY
FLEXIBILITY
LAYERS
Stiffness
THICKNESS
Thin film
THIN FILMS
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Beschreibung
Zusammenfassung:In this paper, a model with a small number of parameters is used to simulate the motion of a cantilever in the AC mode of an atomic force microscope (AFM). The results elucidate the transition dependence—from noncontact to tapping operating mode—on the height of the contamination layer and on the stiffness of the sample.
ISSN:1044-5803
1873-4189
DOI:10.1016/S1044-5803(03)00081-0