High-pressure x-ray tomography microscope: Synchrotron computed microtomography at high pressure and temperature
A new apparatus has been developed for microtomography studies under high pressure. The pressure generation mechanism is based on the concept of the widely used Drickamer anvil apparatus, with two opposed anvils compressed inside a containment ring. Modifications are made with thin aluminum alloy co...
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Veröffentlicht in: | Review of scientific instruments 2005-07, Vol.76 (7), p.073709-073709-7 |
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Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | A new apparatus has been developed for microtomography studies under high pressure. The pressure generation mechanism is based on the concept of the widely used Drickamer anvil apparatus, with two opposed anvils compressed inside a containment ring. Modifications are made with thin aluminum alloy containment rings to allow transmission of x rays. Pressures up to
8
GPa
have been generated with a hydraulic load of
25
T
. The modified Drickamer cell is supported by thrust bearings so that the entire pressure cell can be rotated under load. Spatial resolution of the high pressure tomography apparatus has been evaluated using a sample containing vitreous carbon spheres embedded in FeS matrix, with diameters ranging from
0.01
to
0.2
mm
. Spheres with diameters as small as
0.02
mm
were well resolved, with measured surface-to-volume ratios approaching theoretical values. The sample was then subject to a large shear strain field by twisting the top and bottom Drickamer anvils. Imaging analysis showed that detailed microstructure evolution information can be obtained at various steps of the shear deformation, allowing strain partition determination between the matrix and the inclusions. A sample containing a vitreous
Mg
2
Si
O
4
sphere in FeS matrix was compressed to
5
GPa
, in order to evaluate the feasibility of volume measurement by microtomography. The results demonstrated that quantitative inclusion volume information can be obtained, permitting
in situ
determination of
P
-
V
-
T
equation of state for noncrystalline materials. |
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ISSN: | 0034-6748 1089-7623 |
DOI: | 10.1063/1.1979477 |