Conducting Ni nanoparticles in an ion-modified polymer

Conducting Ni nanoparticles in an ion-modified polymer

Conductive-atomic force microscopy has been used to perform nanoscale current imaging of Ni-ion-implanted polythylene terephthlate films. A reduction in bulk sheet resistivity, as the Ni dose is increased, is found to be accompanied by an evolution in local conductivity from a spatially homogeneous...

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Veröffentlicht in:Journal of applied physics 2005-09, Vol.98 (6), p.066101-066101-3
Hauptverfasser: Sze, J. Y., Tay, B. K., Pakes, C. I., Jamieson, D. N., Prawer, S.
Format: Artikel
Sprache:eng
Schlagworte:
ATOMIC FORCE MICROSCOPY
ELECTRIC CONDUCTIVITY
ION IMPLANTATION
MATERIALS SCIENCE
NANOSTRUCTURES
NICKEL
NICKEL IONS
PARTICLE SIZE
PARTICLES
POLYMERS
THIN FILMS
X-RAY DIFFRACTION
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Beschreibung
Zusammenfassung:Conductive-atomic force microscopy has been used to perform nanoscale current imaging of Ni-ion-implanted polythylene terephthlate films. A reduction in bulk sheet resistivity, as the Ni dose is increased, is found to be accompanied by an evolution in local conductivity from a spatially homogeneous insulator to an interconnected network of conducting Ni crystallites. The crystallites have a mean dimension of 12.3 nm , confirmed by x-ray-diffraction analysis.
ISSN:0021-8979
1089-7550
DOI:10.1063/1.2014938