Ion-beam texturing of uniaxially textured Ni films

The formation of biaxial texture in uniaxially textured Ni thin films via Ar-ion irradiation is reported. The ion-beam irradiation was not simultaneous with deposition. Instead, the ion beam irradiates the uniaxially textured film surface with no impinging deposition flux, which differs from convent...

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Veröffentlicht in:Applied physics letters 2005-07, Vol.87 (3), p.031907-031907-3
Hauptverfasser: Park, S. J., Norton, D. P., Selvamanickam, Venkat
Format: Artikel
Sprache:eng
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Zusammenfassung:The formation of biaxial texture in uniaxially textured Ni thin films via Ar-ion irradiation is reported. The ion-beam irradiation was not simultaneous with deposition. Instead, the ion beam irradiates the uniaxially textured film surface with no impinging deposition flux, which differs from conventional ion-beam-assisted deposition. The uniaxial texture is established via a nonion beam process, with the in-plane texture imposed on the uniaxial film via ion beam bombardment. Within this sequential ion beam texturing method, grain alignment is driven by selective etching and grain overgrowth.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.1957121