Visible, EUV, and X-ray Spectroscopy at the NIST EBIT Facility

Visible, EUV, and X-ray Spectroscopy at the NIST EBIT Facility

After a brief introduction to the NIST EBIT facility, we present the results of three different types of experiments that have been carried out there recently: EUV and visible spectroscopy in support of the microelectronics industry, laboratory astrophysics using an x-ray microcalorimeter, and charg...

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Veröffentlicht in:AIP conference proceedings 2004-01, Vol.730 (1), p.245-254
Hauptverfasser: Gillaspy, J D, Blagojevic, B, Dalgarno, A, Fahey, K, Kharchenko, V, Laming, J M, Le Bigot, E-O, Lugosi, L, Makonyi, K, Ratliff, L P, Schnopper, H W, Silver, E H, Takacs, E, Tan, J N, Tawara, H, Tokesi, K
Format: Artikel
Sprache:eng
Schlagworte:
70 PLASMA PHYSICS AND FUSION TECHNOLOGY
ASTROPHYSICS
CALORIMETERS
CHARGE EXCHANGE
ELECTRON BEAMS
IONS
MICROELECTRONICS
TRAPPING
TRAPS
ULTRAVIOLET RADIATION
X RADIATION
X-RAY SPECTROSCOPY
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Beschreibung
Zusammenfassung:After a brief introduction to the NIST EBIT facility, we present the results of three different types of experiments that have been carried out there recently: EUV and visible spectroscopy in support of the microelectronics industry, laboratory astrophysics using an x-ray microcalorimeter, and charge exchange studies using extracted beams of highly charged ions.
ISSN:0094-243X
1551-7616
DOI:10.1063/1.1824875